検索結果をRefWorksへエクスポートします。対象は1件です。
Export
RT Book, Whole SR Print DC OPAC T1 Psychometrics for educational debates / edited by Leo J. Th. van der Kamp, Willem F. Langerak, and Dato N. M. de Gruijter A1 International Symposium on Educational Testing A1 Kamp, Leo J. Th. van der A1 Langerak, Willem F. A1 Gruijter, Dato N. de YR 1980 FD c1980 SP x, 337 p. K1 Educational tests and measurements -- Congresses PB Wiley PP Chichester ; New York SN 0471275964 LA English (英語) CL LCC:LB3051 CL DC:371.2/6 NO "Proceedings of the Third International Symposium on Educational Testing, held in Leyden, The Netherlands, June 27-30, 1977." NO Includes bibliographies and indexes NO 書誌ID=BB00044871; NCID=BA00735871; LK [OPAC]https://nieropac.nier.go.jp/opac/opac_link/bibid/BB00044871 LK [Webcat Plus]http://webcatplus-equal.nii.ac.jp/libportal/DocDetail?hdn_if_lang=jpn&txt_docid=NCID:BA00735871; [Webcat Plus]http://webcatplus-equal.nii.ac.jp/libportal/EqualFromForm?txt_isbn=0471275964 OL 30