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RT Book, Whole SR Print DC OPAC T1 The Asian engineering brain drain : a study of international relocation into the United States from India, China, Korea, Thailand and Japan / John R. Niland T2 Studies in the social implications of science and technology A1 Niland, John R., 1940- YR 1970 FD 1970 SP xiv, 181 p. K1 Brain drain -- Asia K1 Engineers -- Asia PB Heath Lexington Books PP Lexington, Mass. LA English (英語) CL LCC:TA157 CL DC:331.1/27/095 NO Bibliography: p. [173]-177 NO 書誌ID=BB00105111; NCID=BA10652646; LK [OPAC]https://nieropac.nier.go.jp/opac/opac_link/bibid/BB00105111 LK [Webcat Plus]http://webcatplus-equal.nii.ac.jp/libportal/DocDetail?hdn_if_lang=jpn&txt_docid=NCID:BA10652646 OL 30